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19/30364443 DC
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19/30364443 DC
BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices - Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devicesMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Draft |
| Format | File |
| ICS | 31.080.99 : Other semiconductor devices
|
| Number of pages | 19 |
| Cross references | IEC 62047-35 Ed.1.0 |
| Year | 2019 |
| Country | United Kingdom |