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18/30319114 DC
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18/30319114 DC
BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for microscopy(TIFF/SEM) partTitleEN sectionTitleENMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Draft |
| Format | File |
| ICS | 35.240.70 : IT applications in science
37.020 : Optical equipment |
| Number of pages | 46 |
| Cross references | ISO 20171 |
| Year | 2018 |
| Country | United Kingdom |