M00002941
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TIA/EIA-455-106 1992 Edition, November 1, 1992 FOTP 106 Procedures for Determining Threshold Current of Semiconductor Lasers
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Availability date: 09/09/2021
Description / Abstract: This test covers the wavelength range from 600 nanometers to 1700 nanometers using a spectrophotometer capable of generating visible and near-infrared light. This method covers primary, secondary, and single coatings (e.g., acrylate, polyimide, and silicone), as well as pigmented coatings, that can be prepared in film specimens.